Abstract
Molecular dynamics simulations are used to study the yield strength of thermally annealed nanocrystalline Cu samples. For strain rates of 1 × 1010 and 1 × 109 s-1, the observed yield strength scales with the fractional number of grain boundary (GB) atoms. This observation suggests a new scaling behavior for the onset of plasticity in nanocrystalline materials, controlled not by the grain size alone, but by a combination of both grain size and degree of GB relaxation, as measured by the GB volume.
Original language | English (US) |
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Pages (from-to) | 76-79 |
Number of pages | 4 |
Journal | Scripta Materialia |
Volume | 61 |
Issue number | 1 |
DOIs | |
State | Published - Jul 2009 |
Keywords
- Hall-Petch
- Molecular dynamics
- Nanocrystalline
- Yield strength
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics