Larger, denser designs lead to more defects; higher quality requirements and new test methods lead to an explosion in test data volume. Test compression techniques attempt to do more testing with fewer bits. This article summarizes one such method, X-compact, which addresses how unknowns, the bane of compression and logic BIST techniques, are eliminated.
|Original language||English (US)|
|Number of pages||9|
|Journal||IEEE Design and Test of Computers|
|State||Published - Nov 2005|
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering