X-tolerant test response compaction

Subhasish Mitra; Steven S. Lumetta; Michael Mitzenmacher; Nishant Patil

doi:10.1109/MDT.2005.154

X-tolerant test response compaction

Subhasish Mitra, Steven S. Lumetta, Michael Mitzenmacher, Nishant Patil

Research output: Contribution to journal › Article › peer-review

Abstract

Larger, denser designs lead to more defects; higher quality requirements and new test methods lead to an explosion in test data volume. Test compression techniques attempt to do more testing with fewer bits. This article summarizes one such method, X-compact, which addresses how unknowns, the bane of compression and logic BIST techniques, are eliminated.

Original language	English (US)
Pages (from-to)	566-574
Number of pages	9
Journal	IEEE Design and Test of Computers
Volume	22
Issue number	6
DOIs	https://doi.org/10.1109/MDT.2005.154
State	Published - Nov 2005

ASJC Scopus subject areas

Software
Hardware and Architecture
Electrical and Electronic Engineering

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10.1109/MDT.2005.154

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X-tolerant test response compaction

Abstract

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