X-tolerant test response compaction

Subhasish Mitra, Steven Sam Lumetta, Michael Mitzenmacher, Nishant Patil

Research output: Contribution to journalArticlepeer-review

Abstract

Larger, denser designs lead to more defects; higher quality requirements and new test methods lead to an explosion in test data volume. Test compression techniques attempt to do more testing with fewer bits. This article summarizes one such method, X-compact, which addresses how unknowns, the bane of compression and logic BIST techniques, are eliminated.

Original languageEnglish (US)
Pages (from-to)566-574
Number of pages9
JournalIEEE Design and Test of Computers
Volume22
Issue number6
DOIs
StatePublished - Nov 1 2005

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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