X-tolerant signature analysis

Subhasish Mitra, Steven S. Lumetta, Michael Mitzenmacher

Research output: Contribution to journalConference article

Abstract

Stochastic coding is used to design X-tolerant signature analyzers that can detect defective chips even in the presence of unknown logic values (X's). These signature analyzers can be used for Built-In-Self-Test applications and test data compression. Application of this technique to industrial designs shows that thousands of X's can be tolerated while reducing test response data volume by 50 to 2,000 times compared to traditional scan, with practically no impact on test quality.

Original languageEnglish (US)
Pages (from-to)432-441
Number of pages10
JournalProceedings - International Test Conference
StatePublished - Dec 1 2004
EventProceedings - International Test Conference 2004 - Charlotte, NC, United States
Duration: Oct 26 2004Oct 28 2004

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Applied Mathematics

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