X-ray structure factors for Si nanoparticles

G. Belomoin, M. Alsalhi, A. Al Aql, M. H. Nayfeh

Research output: Contribution to journalArticlepeer-review


The structural change of Si nanocrystals as a function of size was examined. The calculated X-ray structure factors over the range of 1-6 nm were presented. It was examined that how the scattering evolves from broad to sharp features as the particle size increases. It was shown that the transition from molecular-like broad unresolved features to polycrystalline-like resolved peaks can be set at ∼2.15 nm. The scattering change due to surface dimer relaxation, which has been proposed as the basic mechanism of the acquired optical characteristics was examined.

Original languageEnglish (US)
Pages (from-to)5019-5022
Number of pages4
JournalJournal of Applied Physics
Issue number9
StatePublished - May 1 2004

ASJC Scopus subject areas

  • General Physics and Astronomy


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