@article{72df88e38de742bfaa234ea5d53a3bb6,
title = "X-ray reflectivity study of thin film oxide superconductors",
abstract = "Results are presented from X-ray reflectivity measurements that examine the interface roughness of YBa2Cu3O7-x films. We focus on the quality of these interfaces for studies of the London penetration depth using neutron reflection and for tunnel junctions containing Pb cap layers.",
author = "Han, {S. W.} and Pitney, {J. A.} and Miceli, {P. F.} and M. Covington and Greene, {L. H.} and Godbole, {M. J.} and Lowndes, {D. H.}",
note = "We gratefully acknowledge support (P.F.M., S.W.H., J.A.P.) from the Midwest Superconductivity Consortium (MISCON) under the Department of Energy grant no. DE-FG02-90ER45427 and the University of Missouri Research Board. Support (L.H.G, M.C) is also acknow- ledged from the National Science Foundation (DMR-91-20000) through the Science and Technology Center for Superconductivity. Research at Oak Ridge National Laboratory was sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contract DE-AC05-84OR21400 with Martin Marietta Energy Systems, Inc.",
year = "1996",
month = apr,
day = "2",
doi = "10.1016/0921-4526(95)00931-0",
language = "English (US)",
volume = "221",
pages = "235--237",
journal = "Physica B: Condensed Matter",
issn = "0921-4526",
publisher = "Elsevier B.V.",
number = "1-4",
}