X-ray reflectivity study of thin film oxide superconductors

S. W. Han, J. A. Pitney, P. F. Miceli, M. Covington, L. H. Greene, M. J. Godbole, D. H. Lowndes

Research output: Contribution to journalArticlepeer-review

Abstract

Results are presented from X-ray reflectivity measurements that examine the interface roughness of YBa2Cu3O7-x films. We focus on the quality of these interfaces for studies of the London penetration depth using neutron reflection and for tunnel junctions containing Pb cap layers.

Original languageEnglish (US)
Pages (from-to)235-237
Number of pages3
JournalPhysica B: Condensed Matter
Volume221
Issue number1-4
DOIs
StatePublished - Apr 2 1996

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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