We present a study of interdiffusion at interfaces of YBa2Cu3O7-x (YBCO) and metals, Au, Ag, and Pb by using X-ray reflectivity. YBCO thin films were epitaxially grown by off-axis sputter deposition and coevaporation, with the c-axis perpendicular to the SrTiO3 substrate surfaces. The capping layers were subsequently deposited on the YBCO film in situ and ex situ near room temperature. Glancing incident X-ray reflectivity was employed to investigate the surfaces and their buried interfaces. We find that interdiffusion at the interfaces of Au/YBCO and Ag/YBCO is negligible. However, a large interdiffusion zone, ∼60 Å, is present at the Pb/YBCO interface and the lead films grown, both in situ and ex situ, were entirely oxidized. We do not observe any diffraction peaks from the Pb/YBCO films. The diffraction peaks are found up to (007) from the YBCO films of the Au/YBCO and Ag/YBCO films. This implies that the loss of crystalline structure in a ∼300 Å-thick YBCO film underneath Pb is caused by interdiffusion.
|Original language||English (US)|
|Number of pages||5|
|Journal||Japanese Journal of Applied Physics|
|State||Published - Mar 2003|
- Thin film
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)