X-ray reflectivity study of interdiffusion at YBa2Cu3O7-x and metal interfaces

S. W. Han, S. Tripathy, P. F. Miceli, E. Badica, M. Covington, L. H. Greene, M. Aprili

Research output: Contribution to journalArticlepeer-review


We present a study of interdiffusion at interfaces of YBa2Cu3O7-x (YBCO) and metals, Au, Ag, and Pb by using X-ray reflectivity. YBCO thin films were epitaxially grown by off-axis sputter deposition and coevaporation, with the c-axis perpendicular to the SrTiO3 substrate surfaces. The capping layers were subsequently deposited on the YBCO film in situ and ex situ near room temperature. Glancing incident X-ray reflectivity was employed to investigate the surfaces and their buried interfaces. We find that interdiffusion at the interfaces of Au/YBCO and Ag/YBCO is negligible. However, a large interdiffusion zone, ∼60 Å, is present at the Pb/YBCO interface and the lead films grown, both in situ and ex situ, were entirely oxidized. We do not observe any diffraction peaks from the Pb/YBCO films. The diffraction peaks are found up to (007) from the YBCO films of the Au/YBCO and Ag/YBCO films. This implies that the loss of crystalline structure in a ∼300 Å-thick YBCO film underneath Pb is caused by interdiffusion.

Original languageEnglish (US)
Pages (from-to)1395-1399
Number of pages5
JournalJapanese Journal of Applied Physics
Issue number3
StatePublished - Mar 2003
Externally publishedYes


  • Interdiffusion
  • Interface
  • Reflectivity
  • Superconductor
  • Surface
  • Thin film
  • X-ray
  • YBCO

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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