X-Ray Fluorescence Emission Tomography (XFET) with novel imaging geometries a monte carlo study

Ling Jian Meng, Nan Li, Patrick J. La Riviere

Research output: Contribution to journalArticle

Abstract

This paper presents a feasibility study for using two new imaging geometries for synchrotron X-ray fluorescence emission tomography (XFET) applications. In the proposed approaches, the object is illuminated with synchrotron X-ray beams of various cross-sectional dimensions. The resultant fluorescence photons are detected by high-resolution imaging-spectrometers coupled to collimation apertures. To verify the performance benefits of the proposed methods over the conventional line-by-line scanning approach, we have used both Monte Carlo simulations and an analytical system performance index to compare several different imaging geometries. This study has demonstrated that the proposed XFET approach could lead to a greatly improved imaging speed, which is critical for making XFET a practical imaging modality for a wide range of applications.

Original languageEnglish (US)
Article number6044742
Pages (from-to)3359-3369
Number of pages11
JournalIEEE Transactions on Nuclear Science
Volume58
Issue number6 PART 2
DOIs
StatePublished - Dec 1 2011

Keywords

  • Synchrotron radiation
  • X-ray fluorescence emission tomography (XFET)

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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