X-parameter techniques for signal integrity in high-speed links

Jose Schutt-Aine, Thomas Comberiate

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

X-parameters have been shown to have a wide array of applications in the modeling of nonlinear devices and systems. In this work we demonstrate that they can be combined with LIM and IBIS to produce robust models for high-speed links. In particular IBIS data generation from X parameters is demonstrated and its advantage over currently available methods is discussed.

Original languageEnglish (US)
Title of host publicationProceedings of the 2013 IEEE 15th Electronics Packaging Technology Conference, EPTC 2013
Pages235-239
Number of pages5
DOIs
StatePublished - Dec 1 2013
Event2013 IEEE 15th Electronics Packaging Technology Conference, EPTC 2013 - Singapore, Singapore
Duration: Dec 11 2013Dec 13 2013

Publication series

NameProceedings of the 2013 IEEE 15th Electronics Packaging Technology Conference, EPTC 2013

Other

Other2013 IEEE 15th Electronics Packaging Technology Conference, EPTC 2013
CountrySingapore
CitySingapore
Period12/11/1312/13/13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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