@inproceedings{5d27dc1042cd4428aefc9bc702f2502d,
title = "WCDM2 - Wafer-level charged device model testing with high repeatability",
abstract = "CDM-like unipolar pulses are generated at the wafer level with excellent repeatability and linearity. Pulse width and rise time resemble that of FICDM testers. In-situ pre- and post-stress curve tracing reveals the current failure threshold for the device under test.",
author = "Nathan Jack and Maloney, {Timothy J.} and Bruce Chou and Elyse Rosenbaum",
year = "2011",
doi = "10.1109/IRPS.2011.5784509",
language = "English (US)",
isbn = "9781424491117",
series = "IEEE International Reliability Physics Symposium Proceedings",
pages = "4C.5.1--4C.5.8",
booktitle = "2011 International Reliability Physics Symposium, IRPS 2011",
note = "49th International Reliability Physics Symposium, IRPS 2011 ; Conference date: 10-04-2011 Through 14-04-2011",
}