@inproceedings{a33d961ab3cc4ace8a2835ccc2292981,
title = "Voltage monitor circuit for ESD diagnosis",
abstract = "A newly designed on-chip voltage monitor circuit (VM) is capable of recording for subsequent readout the peak voltage reached at internal nodes during ESD events. Real-time voltage probing techniques during wafer-level CDM are verified using VMs; guidelines are discussed for reducing the impact of probing on current flow.",
author = "Nathan Jack and Elyse Rosenbaum",
year = "2011",
language = "English (US)",
isbn = "1585371971",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011",
note = "2011 33rd Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2011 ; Conference date: 11-09-2011 Through 16-09-2011",
}