Virtually-guided certification with uncertainty quantification applied to die casting

Shantanu Shahane, Soham Mujumdar, Namjung Kim, Pikee Priya, Narayana Aluru, Placid Ferreira, Shiv G. Kapoor, Surya Vanka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Die casting is a type of metal casting in which liquid metal is solidified in a reusable die. In such a complex process, measuring and controlling the process parameters is difficult. Conventional deterministic simulations are insufficient to completely estimate the effect of stochastic variation in the process parameters on product quality. In this research, a framework to simulate the effect of stochastic variation together with verification, validation, and uncertainty quantification is proposed. This framework includes high-speed numerical simulations of solidification, micro-structure and mechanical properties prediction models along with experimental inputs for calibration and validation. Both experimental data and stochastic variation in process parameters with numerical modeling are employed thus enhancing the utility of traditional numerical simulations used in die casting to have a better prediction of product quality. Although the framework is being developed and applied to die casting, it can be generalized to any manufacturing process or other engineering problems as well.

Original languageEnglish (US)
Title of host publicationASME 2018 Verification and Validation Symposium, VVS 2018
PublisherAmerican Society of Mechanical Engineers (ASME)
ISBN (Electronic)9780791840795
DOIs
StatePublished - 2018
EventASME 2018 Verification and Validation Symposium, VVS 2018 - Minneapolis, United States
Duration: May 16 2018May 18 2018

Publication series

NameASME 2018 Verification and Validation Symposium, VVS 2018

Other

OtherASME 2018 Verification and Validation Symposium, VVS 2018
Country/TerritoryUnited States
CityMinneapolis
Period5/16/185/18/18

ASJC Scopus subject areas

  • Computational Theory and Mathematics
  • Information Systems and Management
  • Information Systems

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