Versatile technique for assessing thickness of 2D layered materials by XPS

Dmitry Y. Zemlyanov, Michael Jespersen, Dmitry N. Zakharov, Jianjun Hu, Rajib Paul, Anurag Kumar, Shanee Pacley, Nicholas Glavin, David Saenz, Kyle C. Smith, Timothy S. Fisher, Andrey A. Voevodin

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Engineering & Materials Science

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