TY - GEN
T1 - Velocity saturation current-mode CMOS imaging sensor
AU - Njuguna, Raphael
AU - Gruev, Viktor
PY - 2013/9/9
Y1 - 2013/9/9
N2 - A current-mode CMOS imaging sensor is presented in this paper. The read-out transistor in the photo pixel operates in velocity saturation regime and allows for high linearity between integrated photo charges and output drain current. The column parallel read-out circuitry implements a novel current conveyor with a feedback mechanism which improves matching of the output currents across the imaging array. Correlated double sampling (CDS) is performed on-chip in order to improve noise characteristics of the imager. A prototype of the proposed imaging sensor was fabricated in 0.18μm triple well CMOS process. The sensor operation and measurements are presented.
AB - A current-mode CMOS imaging sensor is presented in this paper. The read-out transistor in the photo pixel operates in velocity saturation regime and allows for high linearity between integrated photo charges and output drain current. The column parallel read-out circuitry implements a novel current conveyor with a feedback mechanism which improves matching of the output currents across the imaging array. Correlated double sampling (CDS) is performed on-chip in order to improve noise characteristics of the imager. A prototype of the proposed imaging sensor was fabricated in 0.18μm triple well CMOS process. The sensor operation and measurements are presented.
UR - http://www.scopus.com/inward/record.url?scp=84883374519&partnerID=8YFLogxK
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U2 - 10.1109/ISCAS.2013.6572418
DO - 10.1109/ISCAS.2013.6572418
M3 - Conference contribution
AN - SCOPUS:84883374519
SN - 9781467357609
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
SP - 2630
EP - 2633
BT - 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
T2 - 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
Y2 - 19 May 2013 through 23 May 2013
ER -