TY - GEN
T1 - VARIUS-TC
T2 - 34th IEEE International Conference on Computer Design, ICCD 2016
AU - Khatamifard, S. Karen
AU - Resch, Michael
AU - Kim, Nam Sung
AU - Karpuzcu, Ulya R.
PY - 2016/11/22
Y1 - 2016/11/22
N2 - Under aggressive miniaturization, unconventional digital switches rapidly come to light, which introduce new sources of variation in design parameters, and hence challenge the manufacturing process further. As a result, performance and power of manufactured hardware becomes greatly unpredictable. Characterizing variation-incurred unpredictability at early stages of the design necessitates dependable architecture-level models of variation, which distill device- and circuit-level details to accurately evaluate system-level implications. In this paper, we introduce a modular architecture-level model of parametric variation to address this challenge. As a case study, we refine our discussion to a representative class of emerging thin-channel switches, FinFETs.
AB - Under aggressive miniaturization, unconventional digital switches rapidly come to light, which introduce new sources of variation in design parameters, and hence challenge the manufacturing process further. As a result, performance and power of manufactured hardware becomes greatly unpredictable. Characterizing variation-incurred unpredictability at early stages of the design necessitates dependable architecture-level models of variation, which distill device- and circuit-level details to accurately evaluate system-level implications. In this paper, we introduce a modular architecture-level model of parametric variation to address this challenge. As a case study, we refine our discussion to a representative class of emerging thin-channel switches, FinFETs.
UR - http://www.scopus.com/inward/record.url?scp=85006829824&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85006829824&partnerID=8YFLogxK
U2 - 10.1109/ICCD.2016.7753353
DO - 10.1109/ICCD.2016.7753353
M3 - Conference contribution
AN - SCOPUS:85006829824
T3 - Proceedings of the 34th IEEE International Conference on Computer Design, ICCD 2016
SP - 654
EP - 661
BT - Proceedings of the 34th IEEE International Conference on Computer Design, ICCD 2016
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 2 October 2016 through 5 October 2016
ER -