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Variable temperature scanning tunneling microscope
Joseph W Lyding
(Inventor)
University of Illinois Urbana-Champaign
Electrical and Computer Engineering
Beckman Institute for Advanced Science and Technology
Coordinated Science Lab
Materials Science and Engineering
Micro and Nanotechnology Lab
Research output
:
Patent
Overview
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Engineering & Materials Science
Microscopes
100%
Scanning
80%
Hot Temperature
49%
Gears
45%
Temperature
41%