Validity of a fully coherent field model for in-line x-ray phase imaging

Adam M. Zysk, Miles N. Wernick, Mark A. Anastasio

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Accurate models that describe the propagation of partially coherent wave fields and their interaction with refractive index inhomogeneities within a sample are required to optimally design X-ray phase-contrast imaging systems. Several methods have been proposed for the direct propagation of the second-order statistical properties of a wave field. One method, which has been demonstrated for x-ray microscopy, employs a single eikonal for propagation, approximating the phase by an average over the temporal Fourier components of the field. We have revisited this method by use of a coherent mode model from classic coherence theory. Our analysis produces a variant of the transport of intensity equation for partially coherent wave fields.

Original languageEnglish (US)
Title of host publicationDevelopments in X-Ray Tomography VI
DOIs
StatePublished - 2008
Externally publishedYes
EventDevelopments in X-Ray Tomography VI - San Diego, CA, United States
Duration: Aug 12 2008Aug 14 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7078
ISSN (Print)0277-786X

Conference

ConferenceDevelopments in X-Ray Tomography VI
Country/TerritoryUnited States
CitySan Diego, CA
Period8/12/088/14/08

Keywords

  • Coherence
  • Phase-contrast imaging
  • X-ray imaging

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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