Use of quantitative convergent-beam electron diffraction in materials science

Randi Holmestad; Christophe R. Birkeland; Knut Marthinsen; Ragnvald Høier; Jian Min Zuo

doi:10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O

Use of quantitative convergent-beam electron diffraction in materials science

Randi Holmestad
, Christophe R. Birkeland
, Knut Marthinsen
, Ragnvald Høier
, Jian Min Zuo

Research output: Contribution to journal › Article › peer-review

Abstract

Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non- centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed.

Original language	English (US)
Pages (from-to)	130-145
Number of pages	16
Journal	Microscopy research and technique
Volume	46
Issue number	2
DOIs	https://doi.org/10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O
State	Published - Jul 15 1999
Externally published	Yes

Keywords

Bonding
Charge density
Convergent-beam electron diffraction
Energy filtering
Lattice parameter
Non-centrosymmetric
Phase determination
Polarity
Thickness
TiAl

ASJC Scopus subject areas

General Agricultural and Biological Sciences
Anatomy
Instrumentation

Online availability

10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O

Library availability

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Cite this

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abstract = "Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non- centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed.",

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AU - Holmestad, Randi

AU - Birkeland, Christophe R.

AU - Marthinsen, Knut

AU - Høier, Ragnvald

AU - Zuo, Jian Min

PY - 1999/7/15

Y1 - 1999/7/15

N2 - Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non- centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed.

AB - Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non- centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed.

KW - Bonding

KW - Charge density

KW - Convergent-beam electron diffraction

KW - Energy filtering

KW - Lattice parameter

KW - Non-centrosymmetric

KW - Phase determination

KW - Polarity

KW - Thickness

KW - TiAl

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Use of quantitative convergent-beam electron diffraction in materials science

Abstract

Keywords

ASJC Scopus subject areas

Online availability

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