Use of quantitative convergent-beam electron diffraction in materials science

Randi Holmestad, Christophe R. Birkeland, Knut Marthinsen, Ragnvald Høier, Jian Min Zuo

Research output: Contribution to journalArticle

Abstract

Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non- centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed.

Original languageEnglish (US)
Pages (from-to)130-145
Number of pages16
JournalMicroscopy research and technique
Volume46
Issue number2
DOIs
StatePublished - Jul 15 1999
Externally publishedYes

    Fingerprint

Keywords

  • Bonding
  • Charge density
  • Convergent-beam electron diffraction
  • Energy filtering
  • Lattice parameter
  • Non-centrosymmetric
  • Phase determination
  • Polarity
  • Thickness
  • TiAl

ASJC Scopus subject areas

  • Agricultural and Biological Sciences(all)
  • Anatomy
  • Instrumentation

Cite this