Upgrading the field-imaging far-infrared line spectrometer for the Stratospheric Observatory for Infrared Astronomy (SOFIA) with KIDs: Enabling large sample (extragalactic) surveys

Sebastian Colditz, Leslie W. Looney, Frank Bigiel, Christian Fischer, Jacqueline Fischer, Steven Hailey-Dunsheath, Rodrigo Herrera-Camus, Alfred Krabbe, Henry Leduc, Tony Wong, Jonas Zmuidzinas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present the initial design, performance improvements and science opportunities for an upgrade to the Field-Imaging Far-Infrared Line Spectrometer (FIFI-LS). FIFI-LS efficiently measures fine structure cooling lines, delivering critical constraints of the interstellar medium and starforming environments. SOFIA provides the only FIR observational capability in the world, making FIFI-LS a workhorse for FIR lines, combining optimal spectral resolution and a wide velocity range. Its continuous coverage from 51-203 microns makes FIFI-LS a versatile tool to investigate a multitude of diagnostic lines within our galaxy and in extragalactic environments. The sensitivity and field-of-view (FOV) of FIFI-LS are limited by its 90s-era photoconductor arrays. These limits can be overcome by upgrading the instrument using the latest developments in Kinetic Inductance Detectors (KIDs). KIDs provide sensitivity gains in excess of 1.4 and allow larger arrays, enabling an increase in pixel count by an order of magnitude. This increase allows a wider FOV and instantaneous velocity coverage. The upgrade provides gains in point source observation speed by a factor <2 and in mapping speed by a factor <3.5, enabled by the improved sensitivity and pixel count. This upgrade has been proposed to NASA in response to the 2018 SOFIA Next Generation Instrumentation call.

Original languageEnglish (US)
Title of host publicationMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X
EditorsJonas Zmuidzinas, Jian-Rong Gao
PublisherSPIE
ISBN (Electronic)9781510636934
DOIs
StatePublished - 2020
EventMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X 2020 - Virtual, Online, United States
Duration: Dec 14 2020Dec 22 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11453
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X 2020
Country/TerritoryUnited States
CityVirtual, Online
Period12/14/2012/22/20

Keywords

  • FIFI-LS
  • Far-Infrared
  • Integral Field Spectroscopy
  • Kinetic Inductance Detectors
  • SOFIA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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