Uniform InGaAs quantum dot arrays fabricated using nanosphere lithography

X. Qian, J. Li, D. Wasserman, W. D. Goodhue

Research output: Contribution to journalArticlepeer-review

Abstract

We demonstrate the fabrication of optically active uniform InGaAs quantum dot arrays by combining nanosphere lithography and bromine ion-beam-assisted etching on a single InGaAs/GaAs quantum well. A wide range of lateral dot sizes was achieved from an oxygen plasma nanosphere resizing process. The increased lateral confinement of carriers in the dots results in low temperature photoluminescence blueshifts from 0.5 to 11 meV. Additional quantization was achieved using a selective wet-etch process. Our model suggests the presence of a 70 nm dead layer in the outer InGaAs radial edge, which we believe to be a result of defects and dislocations introduced during the dry-etch process.

Original languageEnglish (US)
Article number231907
JournalApplied Physics Letters
Volume93
Issue number23
DOIs
StatePublished - 2008
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Uniform InGaAs quantum dot arrays fabricated using nanosphere lithography'. Together they form a unique fingerprint.

Cite this