Understanding failure localization in mesh networks

Sun Il Kim, Steven Sam Lumetta

Research output: Contribution to conferencePaperpeer-review


A model for node failures was introduced and the measures that effectively address node protection and failure localization in mesh networks were presented. The tradeoff between capacity efficiency and robustness to multiple failures was also investigated. The results of the investigation showed advantages of generalized loopback over ring-based algorithms in robustness and spare capacity in addressing node recovery and multiple failures compared to double cycle cover.

Original languageEnglish (US)
Number of pages2
StatePublished - Jan 1 2002
EventOptical Fiber Communication Conference and Exhibit - Anaheim, CA, United States
Duration: Mar 17 2002Mar 22 2002


OtherOptical Fiber Communication Conference and Exhibit
Country/TerritoryUnited States
CityAnaheim, CA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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