Understanding Cu incorporation in the Cu2xHg2-xGeTe4 structure using resonant x-ray diffraction

Keyphrases

• Carrier Concentration 100%
• Resonant X-ray Diffraction 100%
• Cu Incorporation 100%
• Resonance Energy 75%
• Antisite Defects 75%
• Density Functional Calculations 50%
• Diffraction 50%
• Thermoelectric 50%
• Hole Concentration 25%
• Material System 25%
• Diffraction Experiment 25%
• Disordered Materials 25%
• Cation Ordering 25%
• Functional Materials 25%
• Defect Concentration 25%
• Defect Engineering 25%
• Direct Quantification 25%

Material Science

• Carrier Concentration 100%
• Density 50%
• Crystal Structure 50%
• Thermoelectrics 50%
• Hole Concentration 25%
• Functional Material 25%