Ultrahigh temperature in situ transmission electron microscopy based bicrystal coble creep in zirconia I: Nanowire growth and interfacial diffusivity

K. S.N. Vikrant, Robson L. Grosso, Lin Feng, Eliana N.S. Muccillo, Dereck N.F. Muche, Gowtham S. Jawaharram, Christopher M. Barr, Anthony M. Monterrosa, Ricardo H.R. Castro, R. Edwin García, Khalid Hattar, Shen J. Dillon

Research output: Contribution to journalArticlepeer-review

Abstract

This work demonstrates novel in situ transmission electron microscopy-based microscale single grain boundary Coble creep experiments used to grow nanowires through a solid-state process in cubic ZrO2 between ≈ 1200 °C and ≈ 2100 °C. Experiments indicate Coble creep drives the formation of nanowires from asperity contacts during tensile displacement, which is confirmed by phase field simulations. The experiments also facilitate efficient measurement of grain boundary diffusivity and surface diffusivity. 10 mol% Sc2O3 doped ZrO2 is found to have a cation grain boundary diffusivity of [Formula presented], and surface diffusivity of [Formula presented].

Original languageEnglish (US)
Pages (from-to)530-541
Number of pages12
JournalActa Materialia
Volume199
DOIs
StatePublished - Oct 15 2020

Keywords

  • Creep
  • Electron microscopy
  • ZrO
  • in situ

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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