Ultrahigh-bandwidth WDM signal integrity in silicon-on-insulator nanowire waveguides

Benjamin G. Lee, Xiaogang Chen, Aleksandr Biberman, Xiaoping Liu, I. Wei Hsieh, Cheng Yun Chou, Jerry Dadap, Richard M. Osgood, Keren Bergman, Fengnian Xia, William Green, Lidija Sekaric, Yurii Vlasov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We measure signal degradation from inter-channel crosstalk of ultrahigh-bandwidth signals in silicon-on-insulator waveguides, and single-channel power penalty over a range of injection powers. The results validate the suitability of silicon-based nanowire interconnects for broadband WDM networks.

Original languageEnglish (US)
Title of host publicationLEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings
Pages472-473
Number of pages2
DOIs
StatePublished - 2007
Externally publishedYes
Event20th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Lake Buena Vista, FL, United States
Duration: Oct 21 2007Oct 25 2007

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN (Print)1092-8081

Other

Other20th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Country/TerritoryUnited States
CityLake Buena Vista, FL
Period10/21/0710/25/07

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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