Ultrafast microscopy of solids irradiated by giant picosecond pulses

Hackjin Kim, Dana D Dlott

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Ultrafast processes which are spatially inhomogeneous are best studied by optical techniques which provide simultaneous temporal and spatial resolution. The ultrafast microscope developed in our lab provides picosecond time resolved images with micrometer scale spatial resolution. The principles of ultrafast microscopy, the apparatus itself, and the applications of this apparatus to several important processes, including polymer ablation and dynamic laser beam distortion, are described herein.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsKeith A. Nelson
PublisherPubl by Int Soc for Optical Engineering
Pages175-184
Number of pages10
ISBN (Print)0819402508
StatePublished - Dec 1 1990
EventPicosecond and Femtosecond Spectroscopy from Laboratory to Real World - Los Angeles, CA, USA
Duration: Jan 16 1990Jan 17 1990

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1209
ISSN (Print)0277-786X

Other

OtherPicosecond and Femtosecond Spectroscopy from Laboratory to Real World
CityLos Angeles, CA, USA
Period1/16/901/17/90

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Kim, H., & Dlott, D. D. (1990). Ultrafast microscopy of solids irradiated by giant picosecond pulses. In K. A. Nelson (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 175-184). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1209). Publ by Int Soc for Optical Engineering.