Ultrafast Imaging of Optical Damage in PMMA.

Taehyoung Zyung, Hackjin Kim, Jay C. Postlewaite, Dana D. Dlott

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new imaging system with ultrafast (75 ps) time resolution, the "picosecond microscope" is used to study the damage dynamics of PMMA irradiated at 532 nm. A small diameter (50 m), intense laser pulse is used to damage the PMMA, and a larger diameter, delayed probe pulse is imaged onto a video camera detector. The resultant time-dependent images are a "motion picture" of the damage process.

Original languageEnglish (US)
Title of host publicationLaser Induced Damage in Optical Materials
Subtitle of host publication1987
EditorsHarold E. Bennett, Arthur H. Guenther, David Milam, Brian E. Newnam, M.J. Soileau
PublisherASTM International
Pages98-104
Number of pages7
ISBN (Electronic)9780803144811
DOIs
StatePublished - 1988
Event19th Symposium on Optical Materials for High-Power Lasers - Boulder, United States
Duration: Oct 26 1987Oct 28 1987

Publication series

NameASTM Special Technical Publication
VolumeSTP 1038
ISSN (Print)0066-0558

Conference

Conference19th Symposium on Optical Materials for High-Power Lasers
Country/TerritoryUnited States
CityBoulder
Period10/26/8710/28/87

Keywords

  • Ablation
  • Microscopy
  • Optical damage
  • PMMA = polymethyl methacrylate
  • Shock waves
  • Ultrafast spectroscopy

ASJC Scopus subject areas

  • General Materials Science

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