Ultrafast imaging and the phase problem for inelastic X-ray scattering

Peter Abbamonte; Gerard C.L. Wong; David G. Cahill; James P. Reed; Robert H. Coridan; Nathan W. Schmidt; Ghee Hwee Lai; Young Il Joe; Diego Casa

doi:10.1002/adma.200904098

Ultrafast imaging and the phase problem for inelastic X-ray scattering

Peter Abbamonte, Gerard C.L. Wong, David G. Cahill, James P. Reed, Robert H. Coridan, Nathan W. Schmidt, Ghee Hwee Lai, Young Il Joe, Diego Casa

Research output: Contribution to journal › Article › peer-review

Abstract

A new method for imaging ultrafast dynamics in condensed matter using inelastic X-ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or "phase problem") for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of ∼1 attosecond (10^-18 s) in time and <1 Å in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided.

Original language	English (US)
Pages (from-to)	1141-1147
Number of pages	7
Journal	Advanced Materials
Volume	22
Issue number	10
DOIs	https://doi.org/10.1002/adma.200904098
State	Published - Mar 12 2010

ASJC Scopus subject areas

Materials Science(all)
Mechanics of Materials
Mechanical Engineering

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10.1002/adma.200904098

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AU - Abbamonte, Peter

AU - Wong, Gerard C.L.

AU - Cahill, David G.

AU - Reed, James P.

AU - Coridan, Robert H.

AU - Schmidt, Nathan W.

AU - Lai, Ghee Hwee

AU - Joe, Young Il

AU - Casa, Diego

PY - 2010/3/12

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AB - A new method for imaging ultrafast dynamics in condensed matter using inelastic X-ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or "phase problem") for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of ∼1 attosecond (10-18 s) in time and <1 Å in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided.

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Ultrafast imaging and the phase problem for inelastic X-ray scattering

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