Ultrafast electron energy-loss spectroscopy in transmission electron microscopy

Enrico Pomarico, Ye Jin Kim, F. Javier García De Abajo, Oh Hoon Kwon, Fabrizio Carbone, Renske M. Van Der Veen

Research output: Contribution to journalArticle

Abstract

In the quest for dynamic multimodal probing of a material's structure and functionality, it is critical to be able to quantify the chemical state on the atomic-/nanoscale using element-specific electronic and structurally sensitive tools such as electron energy-loss spectroscopy (EELS). Ultrafast EELS, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photoexcited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe state-of-the-art experimental techniques in this emerging field and its major uses and future applications.

Original languageEnglish (US)
Pages (from-to)497-503
Number of pages7
JournalMRS Bulletin
Volume43
Issue number7
DOIs
StatePublished - Jul 1 2018

Keywords

  • electron energy-loss spectroscopy (EELS)
  • electronic structure
  • laser-induced reaction
  • nanoscale
  • optical properties

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry

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  • Cite this

    Pomarico, E., Kim, Y. J., García De Abajo, F. J., Kwon, O. H., Carbone, F., & Van Der Veen, R. M. (2018). Ultrafast electron energy-loss spectroscopy in transmission electron microscopy. MRS Bulletin, 43(7), 497-503. https://doi.org/10.1557/mrs.2018.148