Ultrafast electron energy-loss spectroscopy in transmission electron microscopy

Enrico Pomarico, Ye Jin Kim, F. Javier García De Abajo, Oh Hoon Kwon, Fabrizio Carbone, Renske M. Van Der Veen

Research output: Contribution to journalArticle

Abstract

In the quest for dynamic multimodal probing of a material's structure and functionality, it is critical to be able to quantify the chemical state on the atomic-/nanoscale using element-specific electronic and structurally sensitive tools such as electron energy-loss spectroscopy (EELS). Ultrafast EELS, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photoexcited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe state-of-the-art experimental techniques in this emerging field and its major uses and future applications.

Original languageEnglish (US)
Pages (from-to)497-503
Number of pages7
JournalMRS Bulletin
Volume43
Issue number7
DOIs
StatePublished - Jul 1 2018

Fingerprint

Electron energy loss spectroscopy
energy dissipation
electron energy
Transmission electron microscopy
transmission electron microscopy
Electromagnetic fields
spectroscopy
emerging
Nanostructures
electromagnetic fields
Electron microscopes
electron microscopes
spatial resolution
electronics
energy

Keywords

  • electron energy-loss spectroscopy (EELS)
  • electronic structure
  • laser-induced reaction
  • nanoscale
  • optical properties

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry

Cite this

Pomarico, E., Kim, Y. J., García De Abajo, F. J., Kwon, O. H., Carbone, F., & Van Der Veen, R. M. (2018). Ultrafast electron energy-loss spectroscopy in transmission electron microscopy. MRS Bulletin, 43(7), 497-503. https://doi.org/10.1557/mrs.2018.148

Ultrafast electron energy-loss spectroscopy in transmission electron microscopy. / Pomarico, Enrico; Kim, Ye Jin; García De Abajo, F. Javier; Kwon, Oh Hoon; Carbone, Fabrizio; Van Der Veen, Renske M.

In: MRS Bulletin, Vol. 43, No. 7, 01.07.2018, p. 497-503.

Research output: Contribution to journalArticle

Pomarico, E, Kim, YJ, García De Abajo, FJ, Kwon, OH, Carbone, F & Van Der Veen, RM 2018, 'Ultrafast electron energy-loss spectroscopy in transmission electron microscopy', MRS Bulletin, vol. 43, no. 7, pp. 497-503. https://doi.org/10.1557/mrs.2018.148
Pomarico, Enrico ; Kim, Ye Jin ; García De Abajo, F. Javier ; Kwon, Oh Hoon ; Carbone, Fabrizio ; Van Der Veen, Renske M. / Ultrafast electron energy-loss spectroscopy in transmission electron microscopy. In: MRS Bulletin. 2018 ; Vol. 43, No. 7. pp. 497-503.
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