TY - JOUR
T1 - Ultimate Decoupling between Surface Topography and Material Functionality in Atomic Force Microscopy Using an Inner-Paddled Cantilever
AU - Dharmasena, Sajith M.
AU - Yang, Zining
AU - Kim, Seok
AU - Bergman, Lawrence A.
AU - Vakakis, Alexander F.
AU - Cho, Hanna
N1 - Funding Information:
This work was supported in part by National Science Foundation Grants CMMI-1619801 at The Ohio State University and CMMI-1463558 at the University of Illinois at Urbana− Champaign. This support is gratefully acknowledged. We also acknowledge the Ohio Supercomputing Center for providing computational resources.
PY - 2018/6/26
Y1 - 2018/6/26
N2 - Atomic force microscopy (AFM) has been widely utilized to gain insight into various material and structural functionalities on the nanometer scale, leading to numerous discoveries and technologies. Despite the phenomenal success in applying AFM to the simultaneous characterization of topological and functional properties of materials, it has continuously suffered from the crosstalk between the observables, causing undesirable artifacts and complicated interpretations. Here, we introduce a two-field AFM probe, namely an inner-paddled cantilever integrating two discrete pathways such that they respond independently to the variations in surface topography and material functionality. Hence, the proposed design allows reliable and potentially quantitative determination of functional properties. In this paper, the efficacy of the proposed design has been demonstrated via piezoresponse force microscopy of periodically poled lithium niobate and collagen, although it can also be applied to other AFM methods such as AFM-based infrared spectroscopy and electrochemical strain microscopy.
AB - Atomic force microscopy (AFM) has been widely utilized to gain insight into various material and structural functionalities on the nanometer scale, leading to numerous discoveries and technologies. Despite the phenomenal success in applying AFM to the simultaneous characterization of topological and functional properties of materials, it has continuously suffered from the crosstalk between the observables, causing undesirable artifacts and complicated interpretations. Here, we introduce a two-field AFM probe, namely an inner-paddled cantilever integrating two discrete pathways such that they respond independently to the variations in surface topography and material functionality. Hence, the proposed design allows reliable and potentially quantitative determination of functional properties. In this paper, the efficacy of the proposed design has been demonstrated via piezoresponse force microscopy of periodically poled lithium niobate and collagen, although it can also be applied to other AFM methods such as AFM-based infrared spectroscopy and electrochemical strain microscopy.
KW - atomic force microscopy
KW - contact resonance
KW - contact-mode functional AFM
KW - inner-paddled microcantilever
KW - piezoresponse force microscopy
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U2 - 10.1021/acsnano.8b01319
DO - 10.1021/acsnano.8b01319
M3 - Article
C2 - 29800518
AN - SCOPUS:85047738272
VL - 12
SP - 5559
EP - 5569
JO - ACS Nano
JF - ACS Nano
SN - 1936-0851
IS - 6
ER -