Ultimate Decoupling between Surface Topography and Material Functionality in Atomic Force Microscopy Using an Inner-Paddled Cantilever

Sajith M. Dharmasena, Zining Yang, Seok Kim, Lawrence Bergman, Alexander F. Vakakis, Hanna Cho

Research output: Contribution to journalArticle

Abstract

Atomic force microscopy (AFM) has been widely utilized to gain insight into various material and structural functionalities on the nanometer scale, leading to numerous discoveries and technologies. Despite the phenomenal success in applying AFM to the simultaneous characterization of topological and functional properties of materials, it has continuously suffered from the crosstalk between the observables, causing undesirable artifacts and complicated interpretations. Here, we introduce a two-field AFM probe, namely an inner-paddled cantilever integrating two discrete pathways such that they respond independently to the variations in surface topography and material functionality. Hence, the proposed design allows reliable and potentially quantitative determination of functional properties. In this paper, the efficacy of the proposed design has been demonstrated via piezoresponse force microscopy of periodically poled lithium niobate and collagen, although it can also be applied to other AFM methods such as AFM-based infrared spectroscopy and electrochemical strain microscopy.

Original languageEnglish (US)
Pages (from-to)5559-5569
Number of pages11
JournalACS Nano
Volume12
Issue number6
DOIs
StatePublished - Jun 26 2018

Keywords

  • atomic force microscopy
  • contact resonance
  • contact-mode functional AFM
  • inner-paddled microcantilever
  • piezoresponse force microscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy(all)

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