Two‐beam features in electron diffraction patterns – application to refinement of low‐order structure factors in GaAs

K. Gjønnes, J. Gjønnes, J. Zuo, J. C.H. Spence

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)810-820
Number of pages11
JournalActa Crystallographica Section A
Issue number6
StatePublished - Nov 1988
Externally publishedYes

ASJC Scopus subject areas

  • Structural Biology

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