Two forms of nanoscale order in amorphous GexSe1-x alloys

Kristof Darmawikarta, Tian Li, Stephen G. Bishop, John R. Abelson

Research output: Contribution to journalArticle

Abstract

We analyze the evolution of nanoscale order in amorphous Ge xSe1-x alloys using fluctuation electron microscopy. We identify two distinct structural signatures that behave independently as a function of composition. The strong signature of order at scattering vectors k ∼ 0.30 and 0.55 Å-1 in Ge-rich alloys (x > 0.40) diminishes rapidly in Se-rich compositions. However, a second signature of order at scattering vector k ∼ 0.15 Å-1 appears only for compositions in the middle range x = 0.30-0.53. We interpret that structural ordering occurs among pure Ge tetrahedra or among GeSe4 tetrahedra, respectively, in amorphous GexSe1-x.

Original languageEnglish (US)
Article number131908
JournalApplied Physics Letters
Volume103
Issue number13
DOIs
StatePublished - Sep 23 2013

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signatures
tetrahedrons
scattering
electron microscopy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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Two forms of nanoscale order in amorphous GexSe1-x alloys. / Darmawikarta, Kristof; Li, Tian; Bishop, Stephen G.; Abelson, John R.

In: Applied Physics Letters, Vol. 103, No. 13, 131908, 23.09.2013.

Research output: Contribution to journalArticle

Darmawikarta, Kristof ; Li, Tian ; Bishop, Stephen G. ; Abelson, John R. / Two forms of nanoscale order in amorphous GexSe1-x alloys. In: Applied Physics Letters. 2013 ; Vol. 103, No. 13.
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