Abstract
Two and three photon ionization of Xe has been studied using excimer lasers. Employing a microwave bridge to determine the temporal behavior of the absolute photoelectron density, the cross-section for two photon ionization of Xe at 193 nm has been measured. An order of magnitude improvement in the peak electron density is realized by ionizing Xe with two XeF (351. 1 nm) and one ArF (193. 3 nm) photons.
| Original language | English (US) |
|---|---|
| Title of host publication | AIP Conference Proceedings |
| Publisher | AIP |
| Pages | 128-141 |
| Number of pages | 14 |
| Edition | 100 |
| ISBN (Print) | 0883181991, 9780883181997 |
| DOIs | |
| State | Published - 1983 |
Publication series
| Name | AIP Conference Proceedings |
|---|---|
| Number | 100 |
| ISSN (Print) | 0094-243X |
ASJC Scopus subject areas
- Physics and Astronomy(all)