TruePIE: Discovering reliable patterns in pattern-based information extraction

Qi Li, Meng Jiang, Xikun Zhang, Meng Qu, Timothy Hanratty, Jing Gao, Jiawei Han

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Pattern-based methods have been successful in information extraction and NLP research. Previous approaches learn the quality of a textual pattern as relatedness to a certain task based on statistics of its individual content (e.g., length, frequency) and hundreds of carefully-annotated labels. However, patterns of good content-quality may generate heavily conflicting information due to the big gap between relatedness and correctness. Evaluating the correctness of information is critical in (entity, attribute, value)-tuple extraction. In this work, we propose a novel method, called TruePIE, that finds reliable patterns which can extract not only related but also correct information. TruePIE adopts the self-training framework and repeats the training-predicting-extracting process to gradually discover more and more reliable patterns. To better represent the textual patterns, pattern embeddings are formulated so that patterns with similar semantic meanings are embedded closely to each other. The embeddings jointly consider the local pattern information and the distributional information of the extractions. To conquer the challenge of lacking supervision on patterns' reliability, TruePIE can automatically generate high quality training patterns based on a couple of seed patterns by applying the arity-constraints to distinguish highly reliable patterns (i.e., positive patterns) and highly unreliable patterns (i.e., negative patterns). Experiments on a huge news dataset (over 25GB) demonstrate that the proposed TruePIE significantly outperforms baseline methods on each of the three tasks: reliable tuple extraction, reliable pattern extraction, and negative pattern extraction.

Original languageEnglish (US)
Title of host publicationKDD 2018 - Proceedings of the 24th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining
PublisherAssociation for Computing Machinery
Pages1675-1684
Number of pages10
ISBN (Print)9781450355520
DOIs
StatePublished - Jul 19 2018
Event24th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD 2018 - London, United Kingdom
Duration: Aug 19 2018Aug 23 2018

Publication series

NameProceedings of the ACM SIGKDD International Conference on Knowledge Discovery and Data Mining

Other

Other24th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD 2018
Country/TerritoryUnited Kingdom
CityLondon
Period8/19/188/23/18

Keywords

  • Information Extraction
  • Pattern Embedding
  • Pattern Reliability
  • Textual Patterns

ASJC Scopus subject areas

  • Software
  • Information Systems

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