Transmission low‐energy electron diffraction (TLEED) and its application to the low‐voltage point‐projection microscope

W. Qian, J. C.H. Spence, J. M. Zuo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)436-445
Number of pages10
JournalActa Crystallographica Section A
Issue number3
StatePublished - May 1993
Externally publishedYes

ASJC Scopus subject areas

  • Structural Biology

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