Transient analysis of resonant waveguide devices using a hybrid FETD-GSM algorithm

Kedi Zhang, Jian Ming Jin, Chao Fu Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A hybrid algorithm that combines the finite-element time-domain (FETD) method with the generalized scattering matrix (GSM) method is introduced to model resonant waveguide devices. The device is divided into several subdomains with each truncated with the waveguide port boundary condition (WPBC) to suppress resonance and therefore reduce the total number of time-marching steps. The subdomains are analyzed by the FETD method and characterized by broadband GSMs. The GSM of the original device is recovered by cascading the subdomain GSMs. A numerical example is presented to demonstrate the accuracy and efficiency of this algorithm.

Original languageEnglish (US)
Title of host publication2017 IEEE Antennas and Propagation Society International Symposium, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1341-1342
Number of pages2
ISBN (Electronic)9781538632840
DOIs
StatePublished - Oct 18 2017
Event2017 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2017 - San Diego, United States
Duration: Jul 9 2017Jul 14 2017

Publication series

Name2017 IEEE Antennas and Propagation Society International Symposium, Proceedings
Volume2017-January

Other

Other2017 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2017
CountryUnited States
CitySan Diego
Period7/9/177/14/17

    Fingerprint

ASJC Scopus subject areas

  • Radiation
  • Computer Networks and Communications
  • Instrumentation

Cite this

Zhang, K., Jin, J. M., & Wang, C. F. (2017). Transient analysis of resonant waveguide devices using a hybrid FETD-GSM algorithm. In 2017 IEEE Antennas and Propagation Society International Symposium, Proceedings (pp. 1341-1342). (2017 IEEE Antennas and Propagation Society International Symposium, Proceedings; Vol. 2017-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APUSNCURSINRSM.2017.8072713