Transaction log analysis within a bento discovery system

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Academic libraries have introduced bento-style discovery systems to address identified user issues with web-scale discovery systems. The bento systems partition search results into discrete areas on the screen grouped by content format type and/or local service results and address key user needs such as known-item search and streamlined full-text delivery. This poster reports on a transaction log study on the bento discovery system employed at the University of Illinois at Urbana-Champaign Library. The analysis looks at known-item vs exploratory searches, search argument characteristics, and user clickthrough behaviors.

Original languageEnglish (US)
Title of host publicationProceedings - 2019 ACM/IEEE Joint Conference on Digital Libraries, JCDL 2019
EditorsMaria Bonn, Dan Wu, Stephen J. Downie, Alain Martaus
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages420-421
Number of pages2
ISBN (Electronic)9781728115474
DOIs
StatePublished - Jun 2019
Event19th ACM/IEEE Joint Conference on Digital Libraries, JCDL 2019 - Urbana-Champaign, United States
Duration: Jun 2 2019Jun 6 2019

Publication series

NameProceedings of the ACM/IEEE Joint Conference on Digital Libraries
Volume2019-June
ISSN (Print)1552-5996

Conference

Conference19th ACM/IEEE Joint Conference on Digital Libraries, JCDL 2019
CountryUnited States
CityUrbana-Champaign
Period6/2/196/6/19

Keywords

  • Bento Discovery Systems
  • Transaction Log Analysis
  • User Clickthrough Behaviors
  • User Search Behaviors

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Mischo, W. H., Norman, M. A., & Schlembach, M. C. (2019). Transaction log analysis within a bento discovery system. In M. Bonn, D. Wu, S. J. Downie, & A. Martaus (Eds.), Proceedings - 2019 ACM/IEEE Joint Conference on Digital Libraries, JCDL 2019 (pp. 420-421). [8791111] (Proceedings of the ACM/IEEE Joint Conference on Digital Libraries; Vol. 2019-June). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/JCDL.2019.00099