Trade-offs in developing fault tolerant software

N. H. Vaidya; A. D. Singh; C. M. Krishna

doi:10.1049/ip-e.1993.0045

Trade-offs in developing fault tolerant software

N. H. Vaidya, A. D. Singh, C. M. Krishna

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	320-326
Number of pages	7
Journal	IEE Proceedings E: Computers and Digital Techniques
Volume	140
Issue number	6
DOIs	https://doi.org/10.1049/ip-e.1993.0045
State	Published - 1993

ASJC Scopus subject areas

Computer Science(all)
Engineering(all)

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10.1049/ip-e.1993.0045

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title = "Trade-offs in developing fault tolerant software",

author = "Vaidya, {N. H.} and Singh, {A. D.} and Krishna, {C. M.}",

year = "1993",

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pages = "320--326",

journal = "IEE Proceedings E: Computers and Digital Techniques",

issn = "0143-7062",

publisher = "Institution of Electrical Engineers (IEE)",

number = "6",

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AU - Vaidya, N. H.

AU - Singh, A. D.

AU - Krishna, C. M.

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DO - 10.1049/ip-e.1993.0045

M3 - Article

AN - SCOPUS:0027701319

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VL - 140

SP - 320

EP - 326

JO - IEE Proceedings E: Computers and Digital Techniques

JF - IEE Proceedings E: Computers and Digital Techniques

IS - 6

ER -

Trade-offs in developing fault tolerant software

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