Trace ratio vs. ratio trace for dimensionality reduction

Huan Wang, Shuicheng Yan, Dong Xu, Xiaoou Tang, Thomas Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A large family of algorithms for dimensionality reduction end with solving a Trace Ratio problem in the form of arg maxW Tr(WTS pW)/Tr(WTSlW)1, which is generally transformed into the corresponding Ratio Trace form argmaxw Tr[ (W TSlW)-1(WTSPW) ] for obtaining a closed-form but inexact solution. In this work, an efficient iterative procedure is presented to directly solve the Trace Ratio problem. In each step, a Trace Difference problem arg maxiv Tr[WT(Sp - λSl)W] is solved with X being the trace ratio value computed from the previous step. Convergence of the projection matrix W, as well as the global optimum of the trace ratio value λ, are proven based on point-to-set map theories. In addition, this procedure is further extended for solving trace ratio problems with more general constraint WTCW=I and providing exact solutions for kernel-based subspace learning problems. Extensive experiments on faces and UCI data demonstrate the high convergence speed of the proposed solution, as well as its superiority in classification capability over corresponding solutions to the ratio trace problem.

Original languageEnglish (US)
Title of host publication2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07
DOIs
StatePublished - 2007
Externally publishedYes
Event2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07 - Minneapolis, MN, United States
Duration: Jun 17 2007Jun 22 2007

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (Print)1063-6919

Other

Other2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07
Country/TerritoryUnited States
CityMinneapolis, MN
Period6/17/076/22/07

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition

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