Towards blackbox identity testing of log-variate circuits

Michael A. Forbes, Sumanta Ghosh, Nitin Saxena

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Derandomization of blackbox identity testing reduces to extremely special circuit models. After a line of work, it is known that focusing on circuits with constant-depth and constantly many variables is enough (Agrawal,Ghosh,Saxena, STOC'18) to get to general hitting-sets and circuit lower bounds. This inspires us to study circuits with few variables, eg. logarithmic in the size s. We give the first poly(s)-time blackbox identity test for n = O(log s) variate size-s circuits that have poly(s)-dimensional partial derivative space; eg. depth-3 diagonal circuits (or ∧n). The former model is well-studied (Nisan,Wigderson, FOCS'95) but no poly(s2n)-time identity test was known before us. We introduce the concept of cone-closed basis isolation and prove its usefulness in studying log-variate circuits. It subsumes the previous notions of rank-concentration studied extensively in the context of ROABP models.

Original languageEnglish (US)
Title of host publication45th International Colloquium on Automata, Languages, and Programming, ICALP 2018
EditorsChristos Kaklamanis, Daniel Marx, Ioannis Chatzigiannakis, Donald Sannella
PublisherSchloss Dagstuhl- Leibniz-Zentrum fur Informatik GmbH, Dagstuhl Publishing
ISBN (Electronic)9783959770767
DOIs
StatePublished - Jul 1 2018
Event45th International Colloquium on Automata, Languages, and Programming, ICALP 2018 - Prague, Czech Republic
Duration: Jul 9 2018Jul 13 2018

Publication series

NameLeibniz International Proceedings in Informatics, LIPIcs
Volume107
ISSN (Print)1868-8969

Other

Other45th International Colloquium on Automata, Languages, and Programming, ICALP 2018
Country/TerritoryCzech Republic
CityPrague
Period7/9/187/13/18

Keywords

  • Basis isolation
  • Concentration
  • Cone closed
  • Depth-3
  • Derandomization
  • Diagonal
  • Hitting-set
  • Log-variate
  • Polynomial identity testing

ASJC Scopus subject areas

  • Software

Fingerprint

Dive into the research topics of 'Towards blackbox identity testing of log-variate circuits'. Together they form a unique fingerprint.

Cite this