TY - GEN
T1 - Tissue diagnosis using nanoscale morphological markers extracted from quantitative phase images
AU - Takabayashi, Masanori
AU - Majeed, Hassaan
AU - Kajdacsy-Balla, Andre
AU - Popescu, Gabriel
N1 - Funding Information:
This work was supported by National Science Foundation (CBET-0939511 STC, DBI 1450962 EAGER, 1353368, and CBET-1040461 MRI) and by JSPS KAKENHI Grant No. 18K14150.
Funding Information:
This work was supported by National Science Foundation (CBET-0939511 STC, DBI 1450962 EAGER, IIP-1353368, and CBET-1040461 MRI) and by JSPS KAKENHI Grant No. 18K14150.
PY - 2019
Y1 - 2019
N2 - The intrinsic markers of nanoscale morphological alteration in fixed tissue biopsy referred to as disorder strength and local correlation length, which can be easily and time-efficiently obtained from quantitative phase images, are introduced. After presenting how to extract these markers from quantitative phase images obtained by highly sensitive quantitative phase imaging system, spatial light interference microscopy (SLIM), we demonstrate the effectiveness of these markers for diagnosis of benign and malignant breast tissues.
AB - The intrinsic markers of nanoscale morphological alteration in fixed tissue biopsy referred to as disorder strength and local correlation length, which can be easily and time-efficiently obtained from quantitative phase images, are introduced. After presenting how to extract these markers from quantitative phase images obtained by highly sensitive quantitative phase imaging system, spatial light interference microscopy (SLIM), we demonstrate the effectiveness of these markers for diagnosis of benign and malignant breast tissues.
KW - Biopsy slide diagnosis
KW - Breast cancer
KW - Quantitative phase imaging
UR - http://www.scopus.com/inward/record.url?scp=85077799560&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85077799560&partnerID=8YFLogxK
U2 - 10.1117/12.2538728
DO - 10.1117/12.2538728
M3 - Conference contribution
AN - SCOPUS:85077799560
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Design and Testing IX
A2 - Wang, Yongtian
A2 - Benitez, Pablo
A2 - Matoba, Osamu
PB - SPIE
T2 - Optical Design and Testing IX 2019
Y2 - 21 October 2019 through 22 October 2019
ER -