Timing error statistics for energy-efficient robust DSP systems

Rami A. Abdallah, Yu Hung Lee, Naresh R. Shanbhag

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper makes a case for developing statistical timing error models of DSP kernels implemented in nanoscale circuit fabrics. Recently, stochastic computation techniques have been proposed [1], [2], [3], where the explicit use of error-statistics in system design has been shown to significantly enhance robustness and energy-efficiency. However, obtaining the error statistics at different process, voltage, and temperature (PVT) corners is hard. This paper: 1) proposes a simple additive error model for timing errors in arithmetic computations due PVT variations, 2) analyzes the relationship between error statistics and parameters, specifically the input statistics, and 3) presents a characterization methodology to obtain the proposed model parameters and thus enabling efficient implementations of emerging stochastic computing techniques. Key results include the following observations: 1) the output error statistics is a weak function of input statistics, and 2) the output error statistics depends upon the one's probability profile of the input word. These observations enable a one-time off-line statistical error characterization of DSP kernels similar to delay and power characterization done presently for standard cells and IP cores. The proposed error model is derived for a number of DSP kernels in a commercial 45nm CMOS process.

Original languageEnglish (US)
Title of host publicationProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
Pages285-288
Number of pages4
StatePublished - May 31 2011
Event14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011 - Grenoble, France
Duration: Mar 14 2011Mar 18 2011

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
CountryFrance
CityGrenoble
Period3/14/113/18/11

ASJC Scopus subject areas

  • Engineering(all)

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