Abstract
X-ray based spectroscopy techniques are particularly well suited to gain access to local oxidation states and electronic dynamics in complex systems with atomic pinpoint accuracy. Traditionally, these techniques are applied in a quasi-static fashion that usually highlights the steady-state properties of a system rather than the fast dynamics that often define the system function on a molecular level. Novel x-ray spectroscopy techniques enabled by free electron lasers (FELs) and synchrotron based pump-probe schemes provide the opportunity to monitor intramolecular and interfacial charge transfer processes in real-time and with element and chemical specificity. Two complementary time-domain xray photoelectron spectroscopy techniques are presented that are applied at the Linac Coherent Light Source (LCLS) and the Advanced Light Source (ALS) to study charge transfer processes in N3 dye-sensitized ZnO semiconductor nanocrystals, which are at the heart of emerging light-harvesting technologies.
Original language | English (US) |
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Title of host publication | Application of Accelerators in Research and Industry - Twenty-Second International Conference |
Pages | 475-479 |
Number of pages | 5 |
DOIs | |
State | Published - 2013 |
Externally published | Yes |
Event | 22nd International Conference on the Application of Accelerators in Research and Industry, CAARI 2012 - Fort Worth, TX, United States Duration: Aug 5 2012 → Aug 10 2012 |
Publication series
Name | AIP Conference Proceedings |
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Volume | 1525 |
ISSN (Print) | 0094-243X |
ISSN (Electronic) | 1551-7616 |
Other
Other | 22nd International Conference on the Application of Accelerators in Research and Industry, CAARI 2012 |
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Country/Territory | United States |
City | Fort Worth, TX |
Period | 8/5/12 → 8/10/12 |
Keywords
- Dye-Sensitized Nanostructures
- Free Electron Lasers
- Ultrafast Spectroscopy
- X-ray Photoelectron Spectroscopy
ASJC Scopus subject areas
- General Physics and Astronomy