Time-resolved detection of surface plasmon polaritons with a scanning tunneling microscope

Ulrich D. Keil, Taekjip Ha, Jacob R. Jensen, Jorn M. Hvam

Research output: Contribution to conferencePaper

Abstract

The time-resolved detection of surface plasmon polaritons has been carried out with a scanning tunneling microscope (STM). The results indicate that the time-resolved signal is due to rectification of coherently superimposed plasmon voltages. The comparison with differential reflectivity measurements shows that the tip itself influences the decay of the plasmon-field coherence. Generation of the measured signal at the tunneling junction offers the possibility to observe ultrafast effects with a spatial resolution determined by the tunneling junction.

Original languageEnglish (US)
Pages534-535
Number of pages2
DOIs
StatePublished - 1998
EventProceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO - San Francisco, CA, USA
Duration: May 3 1998May 8 1998

Other

OtherProceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO
CitySan Francisco, CA, USA
Period5/3/985/8/98

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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    Keil, U. D., Ha, T., Jensen, J. R., & Hvam, J. M. (1998). Time-resolved detection of surface plasmon polaritons with a scanning tunneling microscope. 534-535. Paper presented at Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO, San Francisco, CA, USA, . https://doi.org/10.1109/cleo.1998.676596