Time-Domain Characterization of Coupled Microstrip Lines

Research output: Contribution to journalArticle

Abstract

A time-domain scheme for the measurement of coupling characteristics of microstrip lines is presented. The method uses the correlation between Maxwellian and physical parameters of the telegrapher’s equations to define the normal modes of the system and to evaluate the propagation characteristics. Self and mutual coefficients are obtained for various levels of coupling and for different aspect ratios.

Original languageEnglish (US)
Pages (from-to)231-235
Number of pages5
JournalIEEE Transactions on Components, Hybrids, and Manufacturing Technology
Volume15
Issue number2
DOIs
StatePublished - Apr 1992

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Microstrip lines
Aspect ratio

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Electronic, Optical and Magnetic Materials
  • Engineering(all)

Cite this

Time-Domain Characterization of Coupled Microstrip Lines. / Schutt-Aine, Jose E.

In: IEEE Transactions on Components, Hybrids, and Manufacturing Technology, Vol. 15, No. 2, 04.1992, p. 231-235.

Research output: Contribution to journalArticle

@article{a3543f56473f4296803d93f1e835a134,
title = "Time-Domain Characterization of Coupled Microstrip Lines",
abstract = "A time-domain scheme for the measurement of coupling characteristics of microstrip lines is presented. The method uses the correlation between Maxwellian and physical parameters of the telegrapher’s equations to define the normal modes of the system and to evaluate the propagation characteristics. Self and mutual coefficients are obtained for various levels of coupling and for different aspect ratios.",
author = "Schutt-Aine, {Jose E}",
year = "1992",
month = "4",
doi = "10.1109/33.142899",
language = "English (US)",
volume = "15",
pages = "231--235",
journal = "IEEE Transactions on Components, Hybrids and Manufacturing Technology",
issn = "0148-6411",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "2",

}

TY - JOUR

T1 - Time-Domain Characterization of Coupled Microstrip Lines

AU - Schutt-Aine, Jose E

PY - 1992/4

Y1 - 1992/4

N2 - A time-domain scheme for the measurement of coupling characteristics of microstrip lines is presented. The method uses the correlation between Maxwellian and physical parameters of the telegrapher’s equations to define the normal modes of the system and to evaluate the propagation characteristics. Self and mutual coefficients are obtained for various levels of coupling and for different aspect ratios.

AB - A time-domain scheme for the measurement of coupling characteristics of microstrip lines is presented. The method uses the correlation between Maxwellian and physical parameters of the telegrapher’s equations to define the normal modes of the system and to evaluate the propagation characteristics. Self and mutual coefficients are obtained for various levels of coupling and for different aspect ratios.

UR - http://www.scopus.com/inward/record.url?scp=0026854514&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026854514&partnerID=8YFLogxK

U2 - 10.1109/33.142899

DO - 10.1109/33.142899

M3 - Article

AN - SCOPUS:0026854514

VL - 15

SP - 231

EP - 235

JO - IEEE Transactions on Components, Hybrids and Manufacturing Technology

JF - IEEE Transactions on Components, Hybrids and Manufacturing Technology

SN - 0148-6411

IS - 2

ER -