Time-Domain Characterization of Coupled Microstrip Lines

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Abstract

A time-domain scheme for the measurement of coupling characteristics of microstrip lines is presented. The method uses the correlation between Maxwellian and physical parameters of the telegrapher’s equations to define the normal modes of the system and to evaluate the propagation characteristics. Self and mutual coefficients are obtained for various levels of coupling and for different aspect ratios.

Original languageEnglish (US)
Pages (from-to)231-235
Number of pages5
JournalIEEE Transactions on Components, Hybrids, and Manufacturing Technology
Volume15
Issue number2
DOIs
StatePublished - Apr 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Engineering(all)
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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