Time-Domain Characterization of Coupled Microstrip Lines

Jose E. Schutt-Aine

doi:10.1109/33.142899

Time-Domain Characterization of Coupled Microstrip Lines

Research output: Contribution to journal › Article › peer-review

Abstract

A time-domain scheme for the measurement of coupling characteristics of microstrip lines is presented. The method uses the correlation between Maxwellian and physical parameters of the telegrapher’s equations to define the normal modes of the system and to evaluate the propagation characteristics. Self and mutual coefficients are obtained for various levels of coupling and for different aspect ratios.

Original language	English (US)
Pages (from-to)	231-235
Number of pages	5
Journal	IEEE Transactions on Components, Hybrids, and Manufacturing Technology
Volume	15
Issue number	2
DOIs	https://doi.org/10.1109/33.142899
State	Published - Apr 1992

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
General Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

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10.1109/33.142899

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abstract = "A time-domain scheme for the measurement of coupling characteristics of microstrip lines is presented. The method uses the correlation between Maxwellian and physical parameters of the telegrapher{\textquoteright}s equations to define the normal modes of the system and to evaluate the propagation characteristics. Self and mutual coefficients are obtained for various levels of coupling and for different aspect ratios.",

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Time-Domain Characterization of Coupled Microstrip Lines

Abstract

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