Keyphrases
Atomic Force Microscopy
33%
Bulk Silicon
33%
Creep
66%
Deformation Mechanism
33%
Dislocation
33%
Dislocation Behavior
33%
Dislocation nucleation
100%
Ductility
66%
Effective Shear Stress
33%
Flaw Tolerance
33%
High Stress
33%
High Temperature
66%
In Situ
33%
Low Temperature
33%
Mechanistic Model
33%
Microbeam
100%
Microscopic Analysis
33%
Miniaturized Device
33%
Multicrystalline Silicon
33%
Nucleation Site
33%
Reliable Design
33%
Scanning Transmission Electron Microscopy
33%
Shear Stress Drop
33%
Thermomechanical Test
33%
Threshold Stress
66%
Time-dependent Plasticity
100%
Uniform Space
33%
Engineering
Atomic Force Microscopy
50%
Bulk Silicon
50%
Creep
100%
Deformation Mechanism
50%
Fits and Tolerances
50%
Low-Temperature
50%
Mechanistic Model
50%
Nucleation Site
50%
Silicon Single Crystal
50%
Threshold Stress
100%
Material Science
Atomic Force Microscopy
16%
Bulk Silicon
16%
Creep
33%
Deformation Mechanism
16%
Nucleation
100%
Scanning Transmission Electron Microscopy
16%
Silicon
100%
Single Crystal
16%
Surface (Surface Science)
33%