Keyphrases
Dislocation nucleation
100%
Time-dependent Plasticity
100%
Microbeam
100%
High Temperature
66%
Creep
66%
Ductility
66%
Threshold Stress
66%
Low Temperature
33%
Multicrystalline Silicon
33%
Dislocation
33%
In Situ
33%
Bulk Silicon
33%
Atomic Force Microscopy
33%
High Stress
33%
Scanning Transmission Electron Microscopy
33%
Deformation Mechanism
33%
Mechanistic Model
33%
Dislocation Behavior
33%
Nucleation Site
33%
Microscopic Analysis
33%
Miniaturized Device
33%
Uniform Space
33%
Thermomechanical Test
33%
Effective Shear Stress
33%
Reliable Design
33%
Flaw Tolerance
33%
Shear Stress Drop
33%
Engineering
Creep
100%
Threshold Stress
100%
Low-Temperature
50%
Bulk Silicon
50%
Silicon Single Crystal
50%
Transmissions
50%
Atomic Force Microscopy
50%
Deformation Mechanism
50%
Mechanistic Model
50%
Anchors
50%
Fits and Tolerances
50%
Nucleation Site
50%
Material Science
Silicon
100%
Nucleation
100%
Creep
33%
Single Crystal
16%
Bulk Silicon
16%
Scanning Transmission Electron Microscopy
16%
Deformation Mechanism
16%
Microscopy
16%