Tilted Dark Field TEM of Twinning and Twisting in Tri- and Bi-layer Graphene

Robert Hovden; Lola Brown; Pinshane Huang; Michal Wojik; David A. Muller; Jiwoong Park

doi:10.1017/S1431927612009452

Tilted Dark Field TEM of Twinning and Twisting in Tri- and Bi-layer Graphene

Robert Hovden, Lola Brown, Pinshane Huang, Michal Wojik, David A. Muller, Jiwoong Park

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1520-1521
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612009452
State	Published - Jul 2012
Externally published	Yes

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Instrumentation

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10.1017/S1431927612009452

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title = "Tilted Dark Field TEM of Twinning and Twisting in Tri- and Bi-layer Graphene",

author = "Robert Hovden and Lola Brown and Pinshane Huang and Michal Wojik and Muller, {David A.} and Jiwoong Park",

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month = jul,

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language = "English (US)",

volume = "18",

pages = "1520--1521",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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T1 - Tilted Dark Field TEM of Twinning and Twisting in Tri- and Bi-layer Graphene

AU - Hovden, Robert

AU - Brown, Lola

AU - Huang, Pinshane

AU - Wojik, Michal

AU - Muller, David A.

AU - Park, Jiwoong

PY - 2012/7

Y1 - 2012/7

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U2 - 10.1017/S1431927612009452

DO - 10.1017/S1431927612009452

M3 - Article

AN - SCOPUS:85007989205

SN - 1431-9276

VL - 18

SP - 1520

EP - 1521

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Tilted Dark Field TEM of Twinning and Twisting in Tri- and Bi-layer Graphene

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