TY - GEN
T1 - Through-the-glass spectroscopic ellipsometry of CdTe solar cells
AU - Chen, Jie
AU - Li, Jian
AU - Thornberry, Courtney
AU - Sestak, Michelle N.
AU - Collins, R. W.
AU - Walker, J. D.
AU - Marsillac, S.
AU - Aquino, A. R.
AU - Rockett, A.
PY - 2009
Y1 - 2009
N2 - Ex-situ spectroscopic ellipsometry (SE) has been advanced for the determination of the optical structure of CdTe solar cells on transparent conducting oxide (TCO) coated glass superstrates. SE measurements directly through the top glass are performed using a method in which the reflection from the glass/film-stack interface is collected whereas the reflection from the ambient/glass interface is blocked. The approach applies reference dielectric functions for the CdS and CdTe deduced from real time SE and for the TCO components from the coated glass before solar cell fabrication. A step-by-step fitting procedure identifies the most important thicknesses and compositional parameters for optimum methodology of characterization. This methodology has potential applications for quantum efficiency predictions, large area mapping, and on-line monitoring. SIMS analysis has been performed in an attempt to corroborate step-by-step analysis of through-the-glass SE data. SIMS and SE are in reasonable accord, and this supports SE as a viable non-invasive method for solar cell analysis at a single point or in a mapping mode.
AB - Ex-situ spectroscopic ellipsometry (SE) has been advanced for the determination of the optical structure of CdTe solar cells on transparent conducting oxide (TCO) coated glass superstrates. SE measurements directly through the top glass are performed using a method in which the reflection from the glass/film-stack interface is collected whereas the reflection from the ambient/glass interface is blocked. The approach applies reference dielectric functions for the CdS and CdTe deduced from real time SE and for the TCO components from the coated glass before solar cell fabrication. A step-by-step fitting procedure identifies the most important thicknesses and compositional parameters for optimum methodology of characterization. This methodology has potential applications for quantum efficiency predictions, large area mapping, and on-line monitoring. SIMS analysis has been performed in an attempt to corroborate step-by-step analysis of through-the-glass SE data. SIMS and SE are in reasonable accord, and this supports SE as a viable non-invasive method for solar cell analysis at a single point or in a mapping mode.
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U2 - 10.1109/PVSC.2009.5411452
DO - 10.1109/PVSC.2009.5411452
M3 - Conference contribution
AN - SCOPUS:77951570738
SN - 9781424429509
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 1748
EP - 1753
BT - 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
T2 - 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
Y2 - 7 June 2009 through 12 June 2009
ER -