Threshold voltage variation effects on aging-related hard failure rates

Brian Greskamp, Smruti R. Sarangi, Josep Torrellas

Research output: Contribution to journalConference articlepeer-review

Abstract

This paper quantifies the impact of threshold voltage variation on aging-related hard failure rates in a high-performance 65nm processor. Simulations show that threshold voltage variations can accelerate aging substantially, depending on the thermal resistance of the heatsink and the total leakage power of the processor before variation. For unfavorable values of these parameters, our models suggest that the time at which 1% of the processors have failed can decrease by about 60%.

Original languageEnglish (US)
Article number4252875
Pages (from-to)1261-1264
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
DOIs
StatePublished - 2007
Event2007 IEEE International Symposium on Circuits and Systems, ISCAS 2007 - New Orleans, LA, United States
Duration: May 27 2007May 30 2007

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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