Three-dimfnsional fib-oim of ceramic materials

Shen J Dillon, Gregory S. Rohrer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Three-dimensional characterization of materials is important for understanding and predicting their microstructural evolution and properties. Traditional serial sectioning of bulk samples is difficult, tedious, and not well suited for fined grained materials. In recent years, the dual-beam focused ion beam microscope has allowed for the prospect of three-dimensional characterization of fine grained materials to be performed more routinely. However, limited work has been performed on ceramics. Examples of three-dimensional reconstruction of orientation image maps from electron backscatter diffraction patterns are given for yttriastabilized zirconia. alumina. strontium titanate and spinel.

Original languageEnglish (US)
Title of host publicationApplications of Texture Analysis - A Collection of Papers Presented at the 15th International Conference on Textures of Materials, ICOTOM 15
Pages117-124
Number of pages8
Volume201
StatePublished - 2008
Externally publishedYes
EventApplications of Texture Analysis - 15th International Conference on Textures of Materials, ICOTOM 15 - Pittsburgh, PA, United States
Duration: Jun 1 2008Jun 6 2008

Publication series

NameCeramic Transactions
Volume201
ISSN (Print)1042-1122

Other

OtherApplications of Texture Analysis - 15th International Conference on Textures of Materials, ICOTOM 15
CountryUnited States
CityPittsburgh, PA
Period6/1/086/6/08

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

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  • Cite this

    Dillon, S. J., & Rohrer, G. S. (2008). Three-dimfnsional fib-oim of ceramic materials. In Applications of Texture Analysis - A Collection of Papers Presented at the 15th International Conference on Textures of Materials, ICOTOM 15 (Vol. 201, pp. 117-124). (Ceramic Transactions; Vol. 201).