TY - GEN
T1 - Three-dimfnsional fib-oim of ceramic materials
AU - Dillon, Shen J
AU - Rohrer, Gregory S.
PY - 2008
Y1 - 2008
N2 - Three-dimensional characterization of materials is important for understanding and predicting their microstructural evolution and properties. Traditional serial sectioning of bulk samples is difficult, tedious, and not well suited for fined grained materials. In recent years, the dual-beam focused ion beam microscope has allowed for the prospect of three-dimensional characterization of fine grained materials to be performed more routinely. However, limited work has been performed on ceramics. Examples of three-dimensional reconstruction of orientation image maps from electron backscatter diffraction patterns are given for yttriastabilized zirconia. alumina. strontium titanate and spinel.
AB - Three-dimensional characterization of materials is important for understanding and predicting their microstructural evolution and properties. Traditional serial sectioning of bulk samples is difficult, tedious, and not well suited for fined grained materials. In recent years, the dual-beam focused ion beam microscope has allowed for the prospect of three-dimensional characterization of fine grained materials to be performed more routinely. However, limited work has been performed on ceramics. Examples of three-dimensional reconstruction of orientation image maps from electron backscatter diffraction patterns are given for yttriastabilized zirconia. alumina. strontium titanate and spinel.
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M3 - Conference contribution
AN - SCOPUS:57649171254
SN - 9780470408353
VL - 201
T3 - Ceramic Transactions
SP - 117
EP - 124
BT - Applications of Texture Analysis - A Collection of Papers Presented at the 15th International Conference on Textures of Materials, ICOTOM 15
T2 - Applications of Texture Analysis - 15th International Conference on Textures of Materials, ICOTOM 15
Y2 - 1 June 2008 through 6 June 2008
ER -